| 编号 | 中文名称 | 英文名称 |
|---|
| EN 168100-1993
| 分规范：石英晶体元件(能力批准)(包括修改A1和A2)
| Sectional specification: Quartz crystal units (capability approval) (includes amendments A1 and A2:1993)
|
| EN 168101-1992
| 空白详细规范：石英晶体元件(能力批准)
| Blank detail specification: Quartz crystal units (capability approval)
|
| EN 168200-1993
| 分规范：石英晶体元件(鉴定批准)
| Sectional specification; Quartz crystal units (qualification approval)
|
| EN 168201-1992
| 空白详细规范：石英晶体元件(鉴定批准)
| Blank detail specification: quartz crystal units (qualification approval)
|
| EN 169000-1992+A1-1998
| 通用规范：石英晶体振荡器
| Generic specification: quartz crystal controlled oscillatores
|
| EN 169200-1995
| 分规范：石英晶体振荡器(鉴定批准)
| Sectional specification: Quartz crystal controlled oscillators (Qualification approval)
|
| EN 169201-1995
| 空白详细规范：石英晶体振荡器(鉴定批准)
| Blank detail specification: Quarz crystal controlled oscillators (Qualification approval)
|
| EN 60122-1-2002
| 经质量评定的石英晶体元件 第1部分：通用规范
| Quartz crystal units of assessed quality - Part 1: Generic specification (IEC 60122-1:2002) / Note: Endorsement notice
|
| EN 60122-3-2001
| 经质量评定的石英晶体元件 第3部分：标准外形和引线连接
| Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections (IEC 60122-3:2001)
|
| EN 60444-1-1997+A1-1999
| 用π型网络零相位技术测量石英晶体元件参数 第1部分：用π型网络零相位技术测量石英晶体元件的谐振频率和
| Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network (IEC 60444-1:
|
| EN 60444-2-1997
| 用π型网络零相位技术测量石英晶体元件参数 第2部分：测量石英晶体元件动态电容的相位偏置法
| Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980)
|
| EN 60444-3-1997
| 用π型网络零相位技术测量石英晶体元件参数 第3部分：利用有并联电容Co补偿的π型网络相位技术测量频率达2
| Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a pi-network with compensation of the parallel capacitance co (IEC 60444-3:1986)
|
| EN 60444-4-1997
| 用π型网络零相技术测量石英晶体元件参数 第4部分：负载谐振频率fL.负载谐振电阻RL的测量方法及其他导出q
| Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency fL,load resonance resistance RL and the calculation of other derived values of q
|
| EN 60444-5-1997
| 石英晶体元件参数的测量 第5部分：采有自动网络分析技术和误差校正法来测定等效电参数的方法
| Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction (IEC 60444-5:1995)
|
| EN 60444-6-1997
| 石英晶体元件参数的测量 第6部分：激励电平相关性（DLD）的测量
| Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (IEC 60444-6:1995)
|
| EN 60444-8-2003
| 石英晶体元件参数的测量： 第6部分：石英晶体元件表面安装的试验装置
| Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2003) / Note: Endorsement notice
|
| EN 60455-3-2-2003
| 电气绝缘用电抗性化合物树脂 第3部分：单项材料规范 活页2：填石英的环氧树脂化合物
| Resin based reactive compounds used for electrical insulation - Part 3: Specifications for individual materials; Sheet 2: Quartz filled epoxy resinous compounds (IEC 60455-3-2:2003) / Note: Endorsement notice
|
| EN 60679-1-1998+A1-2002+A2-2003
| 经质量评估的石英晶体受控振荡器 第1部分：.总规范
| Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification (IEC 60679-1:1997)
|
| EN 60679-3-2001
| 经质量评估的石英晶体震荡器 第3部分：标准外形和引线连接
| Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections (IEC 60679-3:2001)
|
| EN 60679-4-1-1998
| 经质量评估的石英晶体受控振荡器 第4-1部分：空白详细规范 性能鉴定
| Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval (IEC 60679-4-1:1998)
|
| EN 60679-4-1998
| 石英晶体受控振荡器 第4部分：.分规范 能力鉴定
| Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval (IEC 60679-4:1997)
|
| EN 60679-5-1-1998
| 经质量评估的石英晶体受控振荡器 第5-1部分：空白详细规范 鉴定批准
| Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval (IEC 60679-5-1:1998)
|
| EN 60679-5-1998
| 经质量评估的石英晶体受控振荡器 第5部分：分规范 鉴定批准
| Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval (IEC 60679-5:1998)
|
| EN 60682-1993+A2-1997
| 石英卤钨灯夹封部位温度标准测量方法
| Standard method of measuring the pinch temperature of quartz-tungsten-halogen lamps (IEC 60682:1980 + A1:1987)
|
| EN ISO 3262-13-1998
| 涂料用填充剂 规范和测试方法 第13部分：天然石英(矿物)
| Extenders for paints - Specifications and methods of test - Part 13: Natural quartz (ground) (ISO 3262-13:1997)
|
| EN ISO 3262-15-2000
| 涂料用填充剂 规范和测试方法 第15部分：透明石英
| Extenders for paints - Specifications and methods of test - Part 15: Vitreous silica (ISO 3262-15:2000)
|
| EN ISO 3262-19-2000
| 涂料用填充剂 规范和测试方法 第19部分：沉淀二氧化硅(石英)
| Extenders for paints - Specifications and methods of test - Part 19: Precipitated silica (ISO 3262-19:2000)
|
| EN ISO 3262-20-2000
| 涂料用填充剂 规范和测试方法 第20部分：喷雾二氧化硅(石英)
| Extenders for paints - Specifications and methods of test - Part 20: Fumed silica (ISO 3262-20:2000)
|
| EN ISO 3262-21-2000
| 涂料用填充剂 规范和测试方法 第21部分：石英沙(矿物天然石英)
| Extenders for paints - Specifications and methods of test - Part 21: Silica sand (unground natural quartz) (ISO 3262-21:2000)
|
| prEN 13614-1-1999
| 沥青和沥青粘合剂 用水浸没试验测定沥青乳液的粘着力 第1部分：石英岩碎屑法
| Bitumen and bituminous binders - Determination of adhesivity of bitumen emulsions by water immersion test - Part 1: Quartzite chippings method
|
| prEN 4438-1997
| 航空航天系列 金属材料 试验方法 用透明石英膨胀仪测试固体材料线性热膨胀
| Aerospace series - Metallic materials - Test methods - Linear thermal expansion of solid materials with a vitreous silica dilatometer
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| 编号 | 中文名称 | 英文名称 |
|---|